May 13, 2003
Scientists at Brown University have created a magnetic-sensing microscope that allows them to watch electricity flow through the world’s tiniest components. They are using the device to find defects in integrated circuits and micromachinery.
The scanner removes a barrier to further shrinking of integrated circuits: as circuits get smaller, non-visual defects become harder to find.
They are using the technology to pinpoint how electrical current can form pinholes… read more