Sub-angstrom microscope targets nanotechnology

August 2, 2005 | Source: EE Times

FEI Co. has unveiled what it claims is the highest-resolution scanning-transmission electron microscope, enabling sub-angstrom (atomic scale) imaging and analysis.

A team of researchers plans to use it to make direct observations and analysis of individual atoms at 0.5-angstrom resolution — a key dimension for atomic level research since it is one-third the diameter of a carbon atom.